Click here to make tpub.com your Home Page

Page Title: CHAPTER 4. MAINTENANCE
Back | Up | Next

Click here for thousands of PDF manuals

Google


Web
www.tpub.com

Home


   
Information Categories
.... Administration
Advancement
Aerographer
Automotive
Aviation
Construction
Diving
Draftsman
Engineering
Electronics
Food and Cooking
Logistics
Math
Medical
Music
Nuclear Fundamentals
Photography
Religion
   
   

 

TM 55-4920-430-13
MAINTENANCE
SECTION I TROUBLESHOOTING (CRC)
4-1. General Instructions.
a. Troubleshooting procedures are provided in logic tree format. Testing and troubleshooting are
correlated. For each test paragraph, there is a troubleshooting paragraph with a similar heading. For
each failure to meet a test requirement, there is a trouble symptom with a similar title. Use the
schematic diagrams (see FO-1, 1-3 through 1-12) and the wiring diagrams (see FO-55) as aids in trou-
bleshooting.
b. On wiring diagrams, wire connections to the moving contacts of rotary wafer switches stop at the
edge of the wafer. Physically, the moving contact is on the side of the wafer opposite the fixed contacts
and is centered between two fixed contacts. In troubleshooting logic, moving contacts are identified
with prefix W (wiper).
c. During troubleshooting, observe the following precautions and procedures.
(1) Voltage measurements. This equipment has transistor and microcircuits. When you measure
voltage, use tape or plastic sleeving (spaghetti) to insulate the entire test prod, except for the extreme
tip. A momentary short can ruin a transistor or microcircuit. Use the same or equivalent digital mul-
timeter specified in para 4-2.
(2) Resistance Measurements. Perform resistance and continuity checks with all electrical power
off.
(3) When the test set is disconnected from external test connections, all grounds in the test set are
not at the same potential. Chassis ground is at receptacle pin J7-B. Dc common, logic ground, and ac
signal ground are at TB1-3. Ac neutral is at TB2-7.
(4) Use a card extender, where necessary, for making test measurements at card receptacles.
4-2. Test Equipment Required.
TEST EQUIPMENT
SPECIFICATIONS
Function Generator
0 to 15 vac 90 phase shift
AC Power Supply, 400 Hz
0 to 115 vac
Dual trace, 0 to 100 mHz, 350 picosecond rise time
Digital Multimeter (2 ea)
50 mV to 150 vac 0.5%, 10 mV to 50 vdc 0.1%
Decade Capacitance Box
0.01 to 1.0 uf, 1.0 to 10.0 uf 0.1%
Decade Resistance Box
0.5 ohm to 1.1 megohms
Frequency Counter/Timer
1 Hz to 1 mHz
DC Power Supply 0-36V (2 ea)
0 to 36 vdc, 0.5%
Stop Watch
0.1 sec increments
Signal Test Aid
Local fabricated (fig. 4-10)
Resistance Test Aid
Local fabricated (fig. 4-10)
Card Extenders
Receptacle M55302/27-06 (60 pin)
to plug M55302/26-02

Privacy Statement - Press Release - Copyright Information. - Contact Us

Integrated Publishing, Inc. - A (SDVOSB) Service Disabled Veteran Owned Small Business