Probe Function

TM 11-7010-201-40-1/ET821-AA-MMI-010/E154 MTS/TO 31S5-2TSQ73-2-1

2-13. Probe Function. The probe function (see figure 2-8) allows interfacing with and control of the CUT. The timing

and control function maintains primary control of the internal circuits of the test set probe assembly. The mask function

controls the gates in the probe control logic. The probe control logic is a signal buffer and a series of gates which control

the signals. The test pattern data and modem test data signals (from the data memory function) and the test clocks are

applied to the input of the gates. The card reed switch control signal (from the timing and control function) and the circuit

mask and I/O mask signals (from the mask function) are applied to the gate enables. The MTS logic controls timing of

the gate out-puts. All data lines are terminated in special line terminator networks to keep the CUT operating normally.

Figure 2-8. Probe function Block Diagram

2-21