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TM
11-6625-467-34
under which the circuit failed. Paragraph c below is
ohmmeter. If the resistor is good, continue tracing
the signal path through the audio amplifier/detector
an example of how a trouble could be isolated in a
faulty audio amplifier/detector circuit.
to the TEST METER. If no 1 kHz voltage appears at
the sidetone output, another possible source of trou-
c. Assume that the trouble cited in paragraph
ble is the sidetone gate input. Table 2-4 shows that
3-6b was localized to the audio amplifier/detector
switch S4C connects a positive 10 volts dc through
circuit card. Using the extender card, extend audio
amplifier/detector circuit card HU7 above the card
S4D to the sidetone gate input of the module. Using
cage. Plug a transmit audio module known to be
a multimeter, check for +10 volts at J3-5. If the
voltage is not present, trace it back through S4C
g o o d into J3 and set the CIRCUIT SELECTOR
switches to 3673. Refer to the schematic diagram for
and S4D. The positive 10 volts originates in the
t h e audio amplifier/detector circuit (fig. 3-36).
power supply; refer to figure FO-2 to isolate
Using the oscilloscope, check for the presence of a 1
troubles in the power supply.
kHz signal at pin 17 (test point J2) on the circuit
card and note the amplitude of the signal. Next
NOTE
check for a 1-kHz signal at the emitter of Q1. Tran-
The audio amplifier/detector amplifies and
s i s t o r Q1 is an emitter follower; therefore, the
rectifies the 1 kHz signal. The output is,
amplitude of the signal at the emitter should be just
therefore, a dc voltage that is proportional
slightly less than the input. Transistor Q2 is an
in amplitude to the amplitude of the 1 kHz
amplifier. Check the waveform at the collector of Q2
input signal.
with the oscilloscope. The signal amplitude should
c. Use the same techniques as in b above to local-
be several times greater than that measured at the
ize any trouble that occurs during the performance
emitter of Q1. Transistor Q3 and Q4 are also ampli-
of the test procedures.
fiers. Check for a 1-kHz signal at the collectors of
each transistor and note that the signal amplitude is
3-5. Isolating Troubles
greater than at the output of the preceding stage.
a. Once a trouble has been localized to a func-
Diode CR1 is the detector diode. Measure the dc
tional circuit in the test set, further tests and meas-
level present at the cathode of CR1. The dc voltage
urements must be made to isolate the trouble to a
should be approximately equal to the peak value of
component part. The most useful tool that a techni-
the signal voltage at the collector of Q4. Resistor
cian has for troubleshooting any circuit is his com-
R24, R25, and R30 form an output voltage divider.
plete understanding of the circuit operation. When a
The dc output at pin 8 should be approximately one-
trouble has been localized to a functional circuit,
sixth of the value of the dc voltage at the cathode of
refer to chapter 2 and review the principles of oper-
CR1. When a signal level at the output of a stage
ation of the circuit. Chapter 2 contains simplified
appears to be low or if no signal is present, refer to
schematic diagrams of each functional circuit. These
table 3-2, voltage and resistance readings and check
schematic diagrams do not contain the components,
the dc voltages and resistances on the emitter, base,
switches, and circuits that are not directly involved
and collector of the suspected stage. If the tran-
with the circuit operation. These circuits are more
sistor appears to be faulty, check it with the tran-
easily understood than those on the overall sche-
sistor tester. Refer to paragraphs 3-9 and 3-10 for
m a t i c diagrams (fig. 3-32 through 3-44). It is
replacement of parts on circuit cards.
necessary, however, to refer to the overall sche-
d. Use the techniques in c above to isolate all
matic diagrams for pin numbers on switches and cir-
faults in the test set. For faults in the power supply
cuit cards. Usually a functional circuit, such as the
circuit, refer to the simplified power supply sche-
audio amplifier/detector, is completely contained on
matic diagram (fig. FO-2).
a single circuit card. Isolating a trouble on a single
3-6. Parts Location
circuit card is relatively easy, because all the com-
ponents are easily accessible and are close to each
When troubleshooting the test set, the exact loca-
other. A few circuits, such as the 500-kHz bandpass
tion of a component part may not be apparent. Fig-
filter and the +28-volt power supply, have com-
ures 3-2 through 3-24 show the location of each
ponents located on several circuit cards and on the
c o m p o n e n t part in the test set. Figures 3-11
chassis. The simplified schematic diagrams are par-
through 3-24 show the parts on each of the 13 circuit
ticularly useful for these circuits.
cards and RF power detector assembly. The remain-
b. The first step in isolating a fault in the test set
ing figures show the location of the chassis-mounted
is to extend the suspected circuit card above the
parts. Some parts require special procedures for
card cage with the board extender (fig. 3-9). Next,
removal and installation. Refer to paragraphs 3-11
energize the circuit, by setting up the conditions
through 3-16 before removing any parts.
3-4

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