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 TM 11-6625-2884-30/NAVAIR 16-35TS361 5-2
d.
Procedure.
1.
Measure the 10 ms period of
the modulated pulse on the
SWEEP:
2.0 ms/DIV
(amplitude may vary)
a.
Check voltages of
bench test set power
supplies 1A3 PS1,
1A3 PS2, 1A3 PS3,
and 1A2 PS1.
Replace the two
b.
circuit cards in
the RF modulation
assembly. Rein-
stall circuit cards
if no improvement
is noted.
Replace RF modulation
c.
assembly 1A3.
2. Set the CS FREQ units
switch from 9 down to O
while observing the mod-
ulation period.
Period increases in even
steps from 10 ms to 11 ms.
a. Substitute circuit
card 1A3A1. Restore
circuit card if no
improvement is noted.
b.
Check con scan fre-
quency select switch
1A3S2.
3-31
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